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Polarimetry with Disordered Photonic Structures

Polarimetry with Disordered Photonic Structures


Title: Polarimetry with Disordered Photonic Structures
Author: Juhl, Michael   orcid.org/0000-0003-2142-7831
Leosson, Kristjan   orcid.org/0000-0002-7897-5911
Date: 2019-12-20
Language: English
Scope: 203-211
University/Institute: Háskóli Íslands
University of Iceland
School: Verkfræði- og náttúruvísindasvið (HÍ)
School of Engineering and Natural Sciences (UI)
Department: Raunvísindastofnun (HÍ)
Science Institute (UI)
Series: ACS Photonics;7(1)
ISSN: 2330-4022 (eISSN)
DOI: 10.1021/acsphotonics.9b01420
Subject: Skautun (rafsegulfræði); Vélrænt nám; Polarimetry; Polarization selective devices; Nanophotonics; Nanótækni; Deep neural networks; Machine learning
URI: https://hdl.handle.net/20.500.11815/3297

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Citation:

Michael Juhl, Kristjan Leosson (2020). Polarimetry with Disordered Photonic Structures. ACS Photonics, 7(1), 203-211. doi: 10.1021/acsphotonics.9b01420

Abstract:

In conventional Stokes polarimetry, where the polarimetric information is obtained from a series of intensity measurements, stable and accurate measurements typically require the optical elements to be carefully designed. Here, we propose a paradigm shift where deep neural network assisted polarimeters based on disordered photonic structures perform high quality polarimetric measurements while completely removing the need for specially designed polarization analyzers, demonstrating how disordered photonic structures fabricated without the use of any nanolithography techniques can enable accurate analysis of optical signals. We implement this concept with disorder- engineered nano-scatterers that allow for analyzing varying degrees of disorder and cellophane film that demonstrate the cost-saving potential of the concept. We demonstrate polarimetric performances, calibrated using deep neural networks, that are comparable to commercial polarimeters, does not require prior knowledge of the input wavelength and show a high degree of mechanical stability.

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