Fletta eftir efnisorði "Metal-Insulator-Semiconductor (MIS) Capacitor"

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Detection of very fast interface traps at the SiC/insulator interface using different electrical characterization techniques

Viðarsson, Arnar (University of Iceland, School of Engineering and Natural Sciences, Faculty of Physical Sciences, 2023)

The semiconductor silicon carbide (SiC) might be the key to next-generation of power electronic devices. Its favourable material properties can outperform existing silicon (Si) devices enabling better energy efficiency in power electronics. However, ...