Photoluminescence study of Si<sub>1-x</sub>Ge<sub>x</sub> nanoparticles in various oxide matrices
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Dagsetning
Höfundar
orcid.org/0000-0001-8397-8917 Journal Title
Journal ISSN
Volume Title
Útgefandi
IEEE
Úrdráttur
We investigate the photoluminescence properties of structures comprising of Si1-xGex nanoparticles (NPs) within SiO2, GeO2, TiO2 and Ta2O5 oxide matrices. Of the investigated structures, it was observed that the structures with GeO2 and TiO2 matrices provide increased spectral response (at ~907 and 844 nm respectively) and increased PL intensity. The improved PL characteristic have been attributed to increased diffusion barrier against oxygen which otherwise would result in formation of unwanted oxide at the film-oxide interface, thereby deteriorating the optical properties.
Lýsing
Efnisorð
Nanótækni, Ljósljómun, Oxíð, Nanoparticles, Photoluminescence
Citation
M. T. Sultan, J. T. Gudmundsson, A. Manolescu, M. L. Ciurea, H. G. Svavarsson and S. Ingvarsson, "Photoluminescence study of Si1-xGex nanoparticles in various oxide matrices," 2021 International Semiconductor Conference (CAS), Romania, 2021, pp. 21-24, doi: 10.1109/CAS52836.2021.9604131.