Photoluminescence study of Si<sub>1-x</sub>Ge<sub>x</sub> nanoparticles in various oxide matrices
| dc.contributor | Háskóli Íslands | en_US |
| dc.contributor | University of Iceland | en_US |
| dc.contributor.author | Sultan, Muhammad Taha | |
| dc.contributor.author | Gudmundsson, J. T. | |
| dc.contributor.author | Manolescu, Andrei | |
| dc.contributor.author | Ciurea, Magdalena Lidia | |
| dc.contributor.author | Svavarsson, Halldor | |
| dc.contributor.author | Ingvarsson, Snorri | |
| dc.contributor.department | Raunvísindastofnun (HÍ) | en_US |
| dc.contributor.department | Science Institute (UI) | en_US |
| dc.contributor.school | Verkfræði- og náttúruvísindasvið (HÍ) | en_US |
| dc.contributor.school | School of Engineering and Natural Sciences (UI) | en_US |
| dc.date.accessioned | 2023-02-09T08:23:48Z | |
| dc.date.available | 2023-02-09T08:23:48Z | |
| dc.date.issued | 2021-10-06 | |
| dc.description.abstract | We investigate the photoluminescence properties of structures comprising of Si1-xGex nanoparticles (NPs) within SiO2, GeO2, TiO2 and Ta2O5 oxide matrices. Of the investigated structures, it was observed that the structures with GeO2 and TiO2 matrices provide increased spectral response (at ~907 and 844 nm respectively) and increased PL intensity. The improved PL characteristic have been attributed to increased diffusion barrier against oxygen which otherwise would result in formation of unwanted oxide at the film-oxide interface, thereby deteriorating the optical properties. | en_US |
| dc.description.sponsorship | This work is partially funded by the Icelandic Research Fund Grants nos. 218029 and 196141. | en_US |
| dc.description.version | Pre-print (óritrýnt handrit) | en_US |
| dc.format.extent | 21-24 | en_US |
| dc.identifier.citation | M. T. Sultan, J. T. Gudmundsson, A. Manolescu, M. L. Ciurea, H. G. Svavarsson and S. Ingvarsson, "Photoluminescence study of Si1-xGex nanoparticles in various oxide matrices," 2021 International Semiconductor Conference (CAS), Romania, 2021, pp. 21-24, doi: 10.1109/CAS52836.2021.9604131. | en_US |
| dc.identifier.doi | 10.1109/CAS52836.2021.9604131 | |
| dc.identifier.isbn | 978-1-6654-3571-0 (eISBN) | |
| dc.identifier.issn | 2377-0678 (eISSN) | |
| dc.identifier.journal | 2021 International Semiconductor Conference (CAS) | en_US |
| dc.identifier.uri | https://hdl.handle.net/20.500.11815/3948 | |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.ispartofseries | International Semiconductor Conference (CAS);2021 | |
| dc.relation.url | http://xplorestaging.ieee.org/ielx7/9604113/9604114/09604131.pdf?arnumber=9604131 | en_US |
| dc.rights | info:eu-repo/semantics/openAccess | en_US |
| dc.subject | Nanótækni | en_US |
| dc.subject | Ljósljómun | en_US |
| dc.subject | Oxíð | en_US |
| dc.subject | Nanoparticles | en_US |
| dc.subject | Photoluminescence | en_US |
| dc.title | Photoluminescence study of Si<sub>1-x</sub>Ge<sub>x</sub> nanoparticles in various oxide matrices | en_US |
| dc.type | info:eu-repo/semantics/conferenceObject | en_US |
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