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Oblique angle deposition of nickel thin films by high-power impulse magnetron sputtering

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dc.contributor Háskóli Íslands
dc.contributor University of Iceland
dc.contributor.author Hajihoseini, Hamidreza
dc.contributor.author Kateb, Movaffaq
dc.contributor.author Ingvarsson, Snorri
dc.contributor.author Gudmundsson, Jon Tomas
dc.date.accessioned 2020-06-23T14:27:50Z
dc.date.available 2020-06-23T14:27:50Z
dc.date.issued 2019-09-20
dc.identifier.citation Hajihoseini, H.; Kateb, M.; Ingvarsson, S. Þ.; Gudmundsson, J. T. Beilstein J. Nanotechnol. 2019, 10, 1914–1921. doi:10.3762/bjnano.10.186
dc.identifier.issn 2190-4286
dc.identifier.uri https://hdl.handle.net/20.500.11815/1903
dc.description Publisher's version (útgefin grein)
dc.description.abstract Background: Oblique angle deposition is known for yielding the growth of columnar grains that are tilted in the direction of the deposition flux. Using this technique combined with high-power impulse magnetron sputtering (HiPIMS) can induce unique properties in ferromagnetic thin films. Earlier we have explored the properties of polycrystalline and epitaxially deposited permalloy thin films deposited under 35° tilt using HiPIMS and compared it with films deposited by dc magnetron sputtering (dcMS). The films prepared by HiPIMS present lower anisotropy and coercivity fields than films deposited with dcMS. For the epitaxial films dcMS deposition gives biaxial anisotropy while HiPIMS deposition gives a well-defined uniaxial anisotropy. Results: We report on the deposition of 50 nm polycrystalline nickel thin films by dcMS and HiPIMS while the tilt angle with respect to the substrate normal is varied from 0° to 70°. The HiPIMS-deposited films are always denser, with a smoother surface and are magnetically softer than the dcMS-deposited films under the same deposition conditions. The obliquely deposited HiPIMS films are significantly more uniform in terms of thickness. Cross-sectional SEM images reveal that the dcMS-deposited film under 70° tilt angle consists of well-defined inclined nanocolumnar grains while grains of HiPIMS-deposited films are smaller and less tilted. Both deposition methods result in in-plane isotropic magnetic behavior at small tilt angles while larger tilt angles result in uniaxial magnetic anisotropy. The transition tilt angle varies with deposition method and is measured around 35° for dcMS and 60° for HiPIMS. Conclusion: Due to the high discharge current and high ionized flux fraction, the HiPIMS process can suppress the inclined columnar growth induced by oblique angle deposition. Thus, the ferromagnetic thin films obliquely deposited by HiPIMS deposition exhibit different magnetic properties than dcMS-deposited films. The results demonstrate the potential of the HiPIMS process to tailor the material properties for some important technological applications in addition to the ability to fill high aspect ratio trenches and coating on cutting tools with complex geometries.
dc.description.sponsorship The authors would like to thank Dr. Fridrik Magnus for his helpful advice on interpretation of MOKE results. This work was partially supported by the University of Iceland Research Fund for Doctoral students, the Icelandic Research Fund Grant Nos. 130029 and 196141.
dc.format.extent 1914-1921
dc.language.iso en
dc.publisher Beilstein Institut
dc.relation.ispartofseries Beilstein Journal of Nanotechnology;10(2019)
dc.rights info:eu-repo/semantics/openAccess
dc.subject Glancing angle deposition (GLAD)
dc.subject High-power impulse magnetron sputtering (HiPIMS)
dc.subject Magnetic anisotropy
dc.subject Magnetron sputtering
dc.subject Nickel
dc.subject Oblique angle deposition
dc.subject Rafsegulbylgjur
dc.subject Nikkel
dc.title Oblique angle deposition of nickel thin films by high-power impulse magnetron sputtering
dc.type info:eu-repo/semantics/article
dcterms.license This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited.
dc.description.version Peer Reviewed
dc.identifier.journal Beilstein Journal of Nanotechnology
dc.identifier.doi 10.3762/bjnano.10.186
dc.relation.url https://www.beilstein-journals.org/bjnano/articles/10/186
dc.contributor.department Raunvísindastofnun (HÍ)
dc.contributor.department Science Institute (UI)
dc.contributor.school Verkfræði- og náttúruvísindasvið (HÍ)
dc.contributor.school School of Engineering and Natural Sciences (UI)


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