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Thermoelectric current in topological insulator nanowires with impurities

Thermoelectric current in topological insulator nanowires with impurities

Title: Thermoelectric current in topological insulator nanowires with impurities
Author: Erlingsson, Sigurdur I.   orcid.org/0000-0001-5701-4137
Bardarson, Jens H   orcid.org/0000-0003-3328-8525
Manolescu, Andrei   orcid.org/0000-0002-0713-4664
Date: 2018-04-12
Language: English
Scope: 1156-1161
University/Institute: Háskólinn í Reykjavík
Reykjavik University
School: Tækni- og verkfræðideild (HR)
School of Science and Engineering (RU)
ISSN: 2190-4286
DOI: 10.3762/bjnano.9.107
Subject: Electrical and Electronic Engineering; General Physics and Astronomy; General Materials Science; Nanowires; Thermoelectric current; Topological insulators; Rafmagnsverkfræði; Rafeindaverkfræði; Eðlisfræði; Efnisfræði; Nanótækni
URI: https://hdl.handle.net/20.500.11815/1302

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Erlingsson, S. I.; Bardarson, J. H.; Manolescu, A. Beilstein J. Nanotechnol. 2018, 9, 1156–1161. doi:10.3762/bjnano.9.107


In this paper we consider charge current generated by maintaining a temperature difference over a nanowire at zero voltage bias. For topological insulator nanowires in a perpendicular magnetic field the current can change sign as the temperature of one end is increased. Here we study how this thermoelectric current sign reversal depends on the magnetic field and how impurities affect the size of the thermoelectric current. We consider both scalar and magnetic impurities and show that their influence on the current are quite similar, although the magnetic impurities seem to be more effective in reducing the effect. For moderate impurity concentration the sign reversal persists.


This article is part of the Thematic Series "Topological materials".


This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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